集成电路双面老炼方案研究  

Research of Integrated Circuit’s Domestic Burn-in Experiment with Double-side Board

作　　者：罗晶[1] 赵鹏[1] 王坦[1] Luo Jing;Zhao Peng;Wang Tan(Aerospace Science and Industry Defense Technology Research and Test Center,Beijing,100854)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《电子测试》2020年第23期111-112,96,共3页Electronic Test

摘　　要：动态老炼试验是元器件可靠性试验中极为重要的过程,通过老炼可以剔除早期失效元器件。本论文简单介绍了老炼试验的重要性、实现方式及特点,并结合提出了两种双面老炼板工艺效率改进方案,均能在不增购老炼设备的前提下将老炼效率提升80%以上,并通过实践验证了其可行性。Domestic burn-in experiment is extremely important in evaluating the reliability of integrated circuits,components with initial failure could be eliminated through the experiment.The importance,implementation and characteristic of burn-in experiment is illustrated,and two implement method of double-side(layer)board used to improve burn-in efficiency is proposed.Either of the two method could improve burn-in efficiency by 80%at least without buying extra burn-in equipment,and the feasibility has been proved through practical application.

关 键 词：双面老炼板 效率提升 动态老炼 

分 类 号：TN407[电子电信—微电子学与固体电子学]