基于故障树分析的弹载固态存储器可靠性研究  

Research on Reliability of Missile-Borne Solid-State Memory Based on Fault Tree Analysis

作　　者：胡时光 尤文斌[1] 丁永红[1] 路万里 王海霞 HU Shiguang;YOU Wenbin;DING Yonghong;LU Wanli;WANG Haixia(National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,Shanxi,China)

机构地区：[1]中北大学电子测试技术国家重点实验室,山西太原030051

出　　处：《火炮发射与控制学报》2020年第4期87-92,共6页Journal of Gun Launch & Control

基　　金：国家自然科学基金(61701445)。

摘　　要：针对弹载固态存储器可靠性缺乏定性定量分析和故障难以定位的问题,提出了基于故障树分析的弹载固态存储器可靠性研究。通过分析固态存储器组成,按照部件种类划分可靠性单元,研究其失效机理与失效模式,建立固态存储器的故障树模型,并对其进行定性定量分析,确定该故障树的最小割集,计算各事件概率及重要度。通过对结果的分析可以看出各原因发生的概率及其对系统的影响程度等,从而分析出各部件在系统中的地位,有助于研发测试过程中人员快速定位故障位置,对合理高效地解决该故障提供理论参考依据,为今后固态存储器的研发改进提供参考。A study on the reliability of missile-borned solid-state memory based on fault tree analysis was proposed in view of the lack of qualitative and quantitative analysis in the reliability of missile-borned solid-state memory and the difficulty of fault location. A study was made of the failure mechanism and failure mode by analyzing the composition of the solid-state memory, with the reliability unit divided according to the component type. The fault tree model of the solid-state memory was established, with qualitative and quantitative analyses conducted to determine the minimum cut set of the fault tree and to calculate the probability and importance of each event. Through the analysis of the results, we can see the probability of each cause and its impact on the system so as to analyze the status of each component in the system, which helps the personnel to quickly locate the fault location in the process of research and development test, which provides theoretical references for reasonably and efficiently solving the fault, and which provides referential value for future research, development and improvement of solid-state memory.

关 键 词：固态存储器 故障树分析 可靠性 重要度 

分 类 号：TJ760.6[兵器科学与技术—武器系统与运用工程]