结合属性散射中心模型和空间变迹法的SAR图像旁瓣抑制方法  

Depression of SAR image sidelobes based on combination of attributed scattering center model and spatially variant apodization

作　　者：陈潜[1] 刘金清[2] Chen Qian;Liu Jinqing(Fuzhou University of International Studies and Trade,Fuzhou 350202,China;Fujian Normal University,Fuzhou 350108,China)

机构地区：[1]福州外语外贸学院,福州350202 [2]福建师范大学,福州350108

出　　处：《电子测量与仪器学报》2020年第10期57-64,共8页Journal of Electronic Measurement and Instrumentation

基　　金：福建省基金(2017J01464)资助项目。

摘　　要：针对合成孔径雷达(synthetic aperture radar,SAR)图像旁瓣抑制问题,提出结合属性散射中心模型和空间变迹法(spatially variant apodization,SVA)的新途径。空间变迹法作为一种经典超分辨率图像处理技术,能在抑制旁瓣的同时保持良好的主瓣分辨率。属性散射中心可以很好地描述目标在高频区的电磁散射特性,是分析SAR图像的有力工具。基于属性散射模型的参数估计得到的先验知识再利用空间变迹法处理SAR图像,达到抑制旁瓣的目的。实验结果表明,该方法可以有效抑制SAR图像旁瓣。For the problem of depression of the high sidelobes in synthetic aperture radar(SAR)images,a new way based on attributed scattering center model and spatially variant apodization(SVA)is proposed.SVA is one of the classical super-resolution image processing technologies,which could keep the resolution of mainlobe while depressing the sidelobes.Attributed scattering center can properly depict the scattering properties of targets at high frequency region,which is an important tool to analyze the SAR image.Attributed scattering center is employed to do the parameter estimation and then the parameters are used to do the SVA filter.Experimental show that the effectiveness of the proposed method as for depressing the sidelobes.

关 键 词：合成孔径雷达 空间变迹法 属性散射中心模型 参数估计 旁瓣抑制 

分 类 号：TP753[自动化与计算机技术—检测技术与自动化装置]