功率循环试验中开通时间对高压大功率IGBT模块失效模式的影响及机理分析  

Influence and Mechanism Analysis of Load Pulse Duration on Failure Mode of High Power IGBT Module Under Power Cycling Condition

作　　者：陈杰 邓二平 张一鸣 赵子轩 黄永章 CHEN Jie;DENG Erping;ZHANG Yiming;ZHAO Zixuan;HUANG Yongzhang(State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources(North China Electric Power University),Changping District,Beijing 102206,China)

机构地区：[1]新能源电力系统国家重点实验室(华北电力大学),北京市昌平区102206

出　　处：《中国电机工程学报》2020年第23期7710-7720,共11页Proceedings of the CSEE

基　　金：国家自然科学基金委员会-国家电网公司智能电网联合基金(U1766219);中央高校基本科研业务费专项资金资助(2019MS001)。

摘　　要：通过在功率循环试验条件下建立的IGBT器件寿命模型,外推器件在实际工况下的寿命,一个重要的前提是不同条件下的失效模式和机理相同。虽然开通时间已被证实对寿命存在影响,但对失效模式和机理的影响尚且未知。对3300V/1500A高压大功率IGBT模块在相同的电热条件下,取不同开通时间(1s和2s)进行功率循环试验,并实现对结温、通态压降和准稳态结到壳的热阻等关键参数在每个周期的实时在线测量,结果表明开通时间对模块失效模式影响显著。开通时间为1s时,仅键合线老化失效,而开通时间为2s时,键合线和焊料层同时发生老化并失效,试验前后超声波扫描(scanning acoustic microscope,SAM)图像的对比验证了实验结果。建立IGBT模块的电–力–热多物理场有限元模型,揭示了开通时间对失效模式的影响机制以及模块具体的失效机理。研究成果可以为高压大功率IGBT模块的寿命预测和老化监测提供指导。When the lifetime model of the IGBT module established under the power cycling test is used to extrapolate the lifetime under the actual operating condition, an important premise is that the failure mode and mechanism must be the same under different conditions. Although the load pulse duration ton has been proven to have an impact on lifetime, the impact on failure mode and mechanism is unknown until now. In this paper, 3300 V/1500 A IGBT modules were tested under the same thermal stress but in different load pulse durations, 1 s and 2 s respectively. Meanwhile, the junction temperature, on-state voltage drop and quasi-thermal resistance in each cycle were monitored in real time during the test. The results show that the load pulse duration has a significant effect on the failure mode of the IGBT module. When ton?1 s, all the modules are bond wire lift-off and chip solder intact, but when ton?2 s, the bond wire and chip solder age at the same time. The comparison of Scanning acoustic microscope(SAM) images before and after the test confirmed the experimental results. Furthermore, an electric-mechanical-thermal multi-physics finite element model of the IGBT module was established, and the influence mechanism of the load pulse duration on the failure mode was revealed. This paper can provide guidance for the lifetime prediction and aging monitoring of the high power IGBT module.

关 键 词：高压大功率IGBT模块 功率循环测试 开通时间 失效模式 有限元模型 机理分析 

分 类 号：TN322[电子电信—物理电子学]