基于微控制器的便携式共面电容无损检测系统  

Portable coplanar capacitive non-destructive testing system based on micro-controller

作　　者：殷晓康[1] 邓承杰 曹松 李伟[1] 陈国明[1] 周凯 YIN Xiaokang;DENG Chengjie;CAO Song;LI Wei;CHEN Guoming;ZHOU Kai(Centre for Offshore Engineering and Safety Technology,China University of Petroleum,Qingdao 266580,China;Shandong Special Equipment Inspection Institute Co.,Ltd.,Jinan 250101,China)

机构地区：[1]中国石油大学(华东)海洋油气装备与安全技术研究中心,山东青岛266580 [2]山东省特种设备检验研究院有限公司,山东济南250101

出　　处：《实验技术与管理》2020年第11期103-109,共7页Experimental Technology and Management

基　　金：国家“公共安全风险防控与应急技术装备”重点专项(2016YFC0802303);国家自然科学基金项目(51675536);中央高校基本业务费自主创新项目(18CX02084A)。

摘　　要：设计了基于电容成像原理的便携式无损检测系统,以STM32F446微控制器为核心,具有操作简便的可交互主机和可更换的电容探头,可实现对反映缺陷信息的微小电容信号的实时精确测量。系统软件以相互独立的功能程序为基础,并由实时操作系统调度。系统用户界面友好,支持测量信号的实时处理,可以以云图和峰值图的形式显示缺陷的位置和尺寸信息,并具有历史数据存储和调出功能。测试结果表明,系统可对非导电材料缺陷进行快速无损检测,兼具教学实验价值和现场适应性。A non-destructive testing system based on coplanar capacitive sensing technology is designed. With the STM32 F446 microcontroller as the core, it has an easy operating interactive host and a replaceable capacitance probe, which can realize real-time and accurate measurement of micro capacitance signal reflecting defect information. The system software is based on independent functional programs and scheduled by the real-time operating system. The system has a friendly user interface, supports real-time processing of measurement signals, and can display the location and size information of defects in the form of cloud and peak images, and has the function of historical data storage and retrieval. The testing results show that the system can detect the defects of non-conductive materials rapidly and has the value of teaching experiment and field adaptability.

关 键 词：电容成像 无损检测 便携系统 

分 类 号：TH878[机械工程—仪器科学与技术]