纳米分辨STEM-EELS研究单晶MgO辐照缺陷振动谱  

Vibrational spectroscopy of single MgO before and after irradiation via STEM-EELS

作　　者：赵娜 杜进隆 亓瑞时 时若晨 李跃辉 付恩刚 高鹏 徐军[2] ZHAO Na;DU Jin-long;QI Rui-shi;SHI Ruo-chen;LI Yue-hui;FU En-gang;GAO Peng;XU Jun(The National Museum of China,Beijing 100006;Electron Microscopy Laboratory,School of Physics,Peking University,Beijing 100871;State Key Laboratory of Nuclear Physics and Technology,School of Physics,Peking University,Beijing 100871;International Center for Quantum Materials,Peking University,Beijing 100871,China)

机构地区：[1]中国国家博物馆,北京100006 [2]北京大学电子显微镜实验室,北京100871 [3]北京大学核物理与核技术国家重点实验室,北京100871 [4]北京大学物理学院量子材料研究中心,北京100871

出　　处：《电子显微学报》2020年第6期687-693,共7页Journal of Chinese Electron Microscopy Society

基　　金：广东省重点领域研发计划项目(Nos.2018B030327001,2018B010109009);中国博士后科学基金项目(No.2019M660747);国家自然科学基金资助项目(Nos.11975034,51672007,11974023,12004010).

摘　　要：本文通过离子辐照技术在单晶MgO中引入辐照缺陷,利用X射线衍射(XRD)结合透射电子显微镜(TEM)表征辐照引入的缺陷,使用6 meV能量分辨率和纳米空间分辨的扫描透射电子显微镜电子能量损失谱技术(STEM-EELS)测量辐照前后单晶MgO声子谱。论文研究离子辐照引入点缺陷对单晶MgO声子结构的影响,结果表明辐照点缺陷会引起单晶MgO声子能量的改变。本论文对于发展离子辐照缺陷调控材料声子结构这一技术路线具有重要启发意义。In this work,ion irradiation technology is used to introduce irradiation defects into single crystal MgO and the irradiation induced defects are characterized by X-RayDiffraction(XRD)combined with Transmission Electron Microscope(TEM).The scanning transmission electron microscope electron energy loss spectroscopy(STEM-EELS)with 6 meV energy resolution and nanometer spatial resolution was used to measure the changes of single crystal MgO spectrum after the ion irradiation.This work explored the effect of point defects introduced by ion irradiation on the phonon structure of single crystal MgO.The results show that irradiation induced point defects will cause the change of phonon energy of single crystal MgO.This work provides a critical insight for the development of controlling the phonon structure by introducing ions irradiation defects.

关 键 词：电子能量损失谱 单晶MgO 辐照点缺陷 振动谱 

分 类 号：TH838.6[机械工程—仪器科学与技术] O469[机械工程—精密仪器及机械]