原子分辨的应变场测量与计算方法  

Atomic-resolved strain field measurement and calculation methods

作　　者：杨国 杨成鹏 毛圣成[1] 王立华[1] 张泽[2] 韩晓东[1] YANG Guo;YANG Cheng-peng;MAO Sheng-cheng;WANG Li-hua;ZHANG Ze;HAN Xiao-dong(Beijing Key Laboratory of Advanced Materials Microstructure and Properties,Institute of Microstructure and Properties of Advanced Materials,Beijing University of Technology,Beijing 100124;Department of Materials Science and Engineering,Zhejiang University,Hangzhou Zhejiang 310008,China)

机构地区：[1]北京工业大学固体微结构与性能研究所,北京市先进材料微观结构与性能重点实验室,北京100124 [2]浙江大学材料科学与工程学院,浙江杭州310027

出　　处：《电子显微学报》2020年第6期752-762,共11页Journal of Chinese Electron Microscopy Society

基　　金：北京卓越青年科学家计划资助项目(No.BJJWZYJH01201910005018);国家重点研发计划资助项目(No.2017YFB0305501);国家自然科学基金资助项目(No.11722429);北京市自然科学基金重点资助项目(No.Z180014).

摘　　要：材料在实际应用过程中往往处于应力状态,必定会导致其性能改变。因此,研究材料内部应变,实现材料应变分布的原子尺度高精度测量,可以有效建立微观结构-应变-物理性能的相关性,为材料实际应用提供必要的理论支撑。本文系统综述了应变测量和计算常用的几种方法;讨论了各种方法的适用范围、优缺点、精度以及准确度;并提出了一些进一步提升应变测量精度的方案,以期为应变测量和计算方法的发展提供参考。Materials are often under stress in the actual application process,which will inevitably lead to changes in their properties.The study of the internal strain of materials and the realization of the atomic scale high-precision measurement of strain distribution of materials can establish the correlation of microstructure-strain-physical properties effectively,which provide necessary theoretical support for the actual application of materials.This article systematically reviews several commonly used methods for strain measurement and calculation;discusses the conditions and limitations of various methods,as well as their accuracy and accuracy;and proposes some solutions to further improve the accuracy of strain measurement methods,with a view to provide reference for the accuracy and precision of the strain measurement and calculation methods.

关 键 词：原子分辨率 HRTEM 应变测量 应变场 几何相位法(GPA) 峰对分析法(PPA) 

分 类 号：O765[理学—晶体学] O3