卤化物钙钛矿的电子显微表征及其辐照损伤效应综述  

Review on electron microscopy characterization and irradiation degradation effect of electron beam sensitive halide Perovskite

作　　者：邢雪琦 柯小行 隋曼龄[1] XING Xue-qi;KE Xiao-xing;SUI Man-ling(Institute of Microstructure and Property of Advanced Materials,Beijing University of Technology,Beijing 100124)

机构地区：[1]北京工业大学,材料与制造学部,固体微结构与性能研究所,北京100124

出　　处：《电子显微学报》2020年第6期763-778,共16页Journal of Chinese Electron Microscopy Society

基　　金：科技部国家重点研发计划(No.2016YFB0700704).

摘　　要：卤化物钙钛矿由于其优异的光电性能及其在光伏、光电器件中的应用前景,在近年来得到广泛的关注并取得迅速发展。卤化物钙钛矿具有丰富的结构可调性和性能可调性,不但可形成三维/二维/一维/零维纳米结构,且具有多种不同的相。基于该材料构建的纳米结构与器件,其多相结构、畴壁、晶界和表面缺陷等微结构及其对性能的影响尚不明确,针对该材料的微结构研究具有重要的意义。电子显微镜是重要的微结构表征工具,尽管近年来针对卤化物钙钛矿的电子显微学研究工作已逐步展开,但仍存在较大困难:卤化物钙钛矿材料在电子束辐照作用下极易降解,迅速产生辐照损伤,且降解机理尚未明确。因此,本文着重针对卤化物钙钛矿在电子束辐照下敏感特性的研究进展进行综述。本文分为扫描电镜表征和透射电镜表征两大部分,并分别针对有机无机杂化钙钛矿单晶及薄膜、有机无机杂化钙钛矿二维纳米片、纯无机含铅钙钛矿和纯无机无铅双钙钛矿具体展开讨论。本文将介绍不同材料在不同表征条件下可能产生的损伤,并进一步讨论电子束辐照下的降解机制,在此基础上综述近年来利用先进电子显微学表征方法在降低电子束辐照损伤、获取高分辨像所进行的工作。本文对钙钛矿领域的广大研究人员和相关领域的电子显微学工作者有一定的参考价值。Halide perovskites have attracted much attention due to their unusual properties and great potentials in the use for photovoltaic and optoelectrnonic devices,and have achieved tremendous progress in the past few years.Halide perovskites are highly tunable in both structures and properties,forming multiple phases and structures from 3D to 0D.The properties and performance of perovskite-based nanostructures and devices are closely related to their structures and microstructures,including multiple-phase-coexistence,grain boundaries,surface defects etc.Although electron microscopy(EM)is ideal in the study of microstructures and efforts have been made on EM for halide perovskites,the materials are ultra sensitive to beam irradiation,and the degradation mechanism remains controversial.Hence,we reviewed recent progress on electron microscopy for halide perovskites,paying particular attention to their beam sensitivity when interacted with electron beam.Applications of both scanning electron microscopy(SEM)and transmission electron microscopy(TEM)on halide perovskites are reviewed.TEM for organic-inorganic hybrid perovskites,2D hybrid nanosheets,inorganic Pb-based nanocrystals and inorganic Pb-free double perovskites are discussed in detail,separately.Damage created in TEM is displayed,followed by in-depth discussions on degradation mechanism under different working condition.In addition,recent progress on EM for halide perovskites using low-dose techniques and other state-of-art methods are reviewed.This review may offer useful tips and guidance for researchers in related field.

关 键 词：卤化物钙钛矿太阳能电池材料 能源材料 扫描电镜 透射电镜 辐照损伤 

分 类 号：TG115.215.3[金属学及工艺—物理冶金] TM914.4[金属学及工艺—金属学]