使用移测显微镜测量平行平板的折射率  

Measuring the refractive index of parallel plate using travelling microscope

作　　者：范海英 贾小文 贺秀良 尹霖 赵云飞 FAN Hai-ying;JIA Xiao-wen;HE Xiu-liang;YIN Lin;ZHAO Yun-fei(General Courses Department,Army Military Transportation University,Tianjin 300161,China)

机构地区：[1]陆军军事交通学院基础部,天津300161

出　　处：《物理实验》2021年第1期33-37,共5页Physics Experimentation

摘　　要：依据折射定律,通过移测显微镜测量光线经平行平板产生的位移,确定平行平板的折射率.利用不确定度分析,给出入射角和平板厚度测量范围的建议,并分析了显微镜系统景深对平行平板厚度的限制.实际测量结果与利用阿贝折射仪的测量结果一致,该实验可作为基础物理实验中折射率测量相关实验项目的拓展.According to the law of refraction,the refractive index of parallel plate was determined by measuring the displacement of light rays through a travelling microscope.By means of uncertainty analysis,the suggestions on measurement range of incident angle and plate thickness were given,and the limitation on the thickness of parallel plate was analyzed by the field depth of microscope system.The measured results were same as those obtained by Abbe refractometer,and this experiment could be used as an extension of the basic physics experiment.

关 键 词：折射率 平行平板 移测显微镜 

分 类 号：O435.1[机械工程—光学工程]