基于“单片机+FPGA”的数字芯片自动测试系统设计  

Design of digital chip automatic test system based on SCM+FPGA

作　　者：石英 陈心浩 何湘竹[2] SHI Ying;CHEN Xinhao;HE Xiangzhu(Laboratory and Equipment Administration Department,South-central University for Nationalities,Wuhan 430074,China;College of Electronics and Information,South-central University for Nationalities,Wuhan 430074,China)

机构地区：[1]中南民族大学实验教学与实验室管理中心,湖北武汉430074 [2]中南民族大学电子信息工程学院,湖北武汉430074

出　　处：《实验技术与管理》2020年第12期130-135,共6页Experimental Technology and Management

基　　金：湖北省高等学校省级研究项目(2014188);中南民族大学教研项目(JYX19114);中南民族大学实验室技改项目(JG201603)。

摘　　要：为了解决实验室和实验教学中74系列数字芯片功能和型号测试自动化的问题,该文设计了一套基于"单片机+FPGA"的数字芯片自动测试系统。采用单片机作为控制核心,驱动LCD显示测试信息,扫描按键设置测试参数;采用FPGA作为测试核心,给待测芯片施加激励信号,并将响应信号与预期响应信号进行比较,获得测试结果;设计自定义接口完成单片机与FPGA之间的通信。该系统实现了14、16和20引脚的74系列数字芯片功能和型号测试,具有集成化、多样化、便捷化的特点,极大地提高了实验室和实验教学中芯片的测试效率。In order to solve the problem of function and model test automation of 74 series digital chips in laboratory and experimental teaching,this paper designs a digital chip automatic test system based on SCM+FPGA(field programmable gate array).SCM is used as the control core to drive LCD to display the test information and scan buttons to set the test parameters.FPGA is used as the core of the test,the excitation signal is applied to the chip to be tested,the response signal is compared with the expected response signal,and the test results are obtained.The user-defined interface is designed to complete the communication between SCM and FPGA.The system has realized the function and model test of 74 series digital chips with 14-pin,16-pin and 20-pin respectively.It has the characteristics of integration,diversification and convenience,and greatly improves the test efficiency of chips in laboratory and experimental teaching.

关 键 词：数字芯片自动测试 多功能 多引脚 单片机 FPGA 

分 类 号：TN407[电子电信—微电子学与固体电子学]