Ti3C2Tx薄膜制备与电磁屏蔽性能研究  

Preparation of Ti3C2Tx Films and Electromagnetic Shielding Properties

作　　者：秦文峰[1] 符佳伟 王新远 李亚云 范宇航 QIN Wen-feng;FU Jia-wei;WANG Xin-yuan;LI Ya-yun;FAN Yu-hang(Aviation Engineering Institute,Civil Aviation Flight University of China,Guanghan 618307,China)

机构地区：[1]中国民用航空飞行学院航空工程学院,广汉618307

出　　处：《科学技术与工程》2021年第2期486-490,共5页Science Technology and Engineering

基　　金：民航局教育人才类项目(14002600100017J170);国家级大学生创新创业训练计划(S201910624056)。

摘　　要：为了减少电磁屏蔽对设备的影响,采用真空抽滤方法制备了一种超薄Ti3C2Tx薄膜,在2~18 GHz研究了其电磁屏蔽性能。用扫描电子显微镜(SEM)表征了Ti3C2Tx薄膜断面的微观形貌,X射线衍射仪(XRD)测试了Ti3C2Tx薄膜成分。结果表明:制备的Ti3C2Tx薄膜,具有超薄性、高导电性和高电磁屏蔽性等特点,层层堆积的Ti3C2Tx纳米片提升了电子传输。通过测试可知:14μm厚的Ti3C2Tx薄膜表面电阻仅为509.9 mΩ,电磁屏蔽性能可以达到52.23 dB。分析得知,Ti3C2Tx薄膜电磁屏蔽屏蔽机制是反射主导的,可见Ti3C2Tx薄膜具有优异的电磁屏蔽性能。实验证明,Ti3C2Tx薄膜电磁屏蔽性能超过35 dB,在电磁屏蔽方面具有潜在应用。In order to reduce the impact of electromagnetic shielding on equipment,an ultrathin Ti3C2Tx films was prepared by vacuum filtration with electromagnetic shielding performance in the range of 2~18 GHz.The microstructure of the Ti3C2Tx films was cha-racterized by scanning electron microscopy(SEM),and the composition of the Ti3C2Tx films was measured by X-ray diffraction(XRD).Results show that the Ti3C2Tx films show the characteristics of ultra-thin,high conductivity and high electromagnetic shielding,and the stacked Ti3C2Tx nanosheets have improved electron transmission.The surface resistance of the 14μm Ti3C2Tx film is only 509.9 mΩ,and the electromagnetic shielding performance arrives at 52.23 dB.The shielding mechanism of Ti3C2Tx films electromagnetic shielding is dominated by reflection.It is concluded that Ti3C2Tx films have excellent electromagnetic shielding properties.Experiments show that the electromagnetic shielding performance of Ti3C2Tx films exceed 35 dB,and it has potential applications in electromagnetic shielding.

关 键 词：电磁屏蔽 薄膜 高导电性 Ti3C2Tx 

分 类 号：TB383[一般工业技术—材料科学与工程]