Rapid thin-layer WS_(2) detection based on monochromatic illumination photographs  

作　　者：Xiangmin Hu Cuicui Qiu Dameng Liu 

机构地区：[1]State Key Laboratory of Tribology,Tsinghua University,Beijing,100084,China

出　　处：《Nano Research》2021年第3期840-845,共6页纳米研究（英文版）

基　　金：We acknowledge support from the National Natural Science Foundation of China(Nos.51527901,11890672,and 51705285).

摘　　要：The thickness of two-dimensional(2D)nanomaterials shows a significant effect on their optical and electrical properties.Therefore,a rapid and automatic detection technology of 2D nanomaterials with desired layer-number is required to extend their practical application in optoelectronic devices.In this paper,an image recognition technology was proposed for rapid and reliable identification of thin-layer WS_(2) samples,which combining a layer-thickness identification criterion and a novel image segmentation algorithm.The criterion stemmed from optical contrast study of monochromatic illumination photographs,and the algorithm was based on Canny operator and edge connection iteration.This optical identification method can seek out thin-layer WS_(2) samples on complex surfaces,which provides a promising approach for automatic search of thin-layer nanomaterials.

关 键 词：WS_(2) thickness identification image recognition sample detection 

分 类 号：TB383[一般工业技术—材料科学与工程]