GIS/GIL内部电弧试验中电弧外部效应检测方法  

Detection method for external effect of the internal arc fault test of GIS/GIL

作　　者：李阳 刘浩军[1] 何冰[1] 彭剑飞[1] 胡丁尹[1] 金庆滨 LI Yang;LIU Haojun;HE Bing;PENG Jianfei;HU Dingyin;JIN Qingbin(Xi'an High Voltage Apparatus Research Institute,Xi'an 710077,China)

机构地区：[1]西安高压电器研究院有限责任公司,陕西西安710077

出　　处：《电气应用》2021年第2期61-64,共4页Electrotechnical Application

摘　　要：GIS/GIL内部电弧试验中电弧的外部效应是判断产品试验成败的关键因素。针对目前GIS/GIL内部电弧试验中外部效应时刻判断不便的问题,提出了一种检测方法,并研制了一套用于检测GIS/GIL内部电弧试验中外部效应时刻的装置。该装置已在多个厂家产品内部电弧试验中得到了验证。该方法不仅可在GIS/GIL内部电弧试验中准确检测电弧外部效应是否发生,何时发生,而且安装布置简单方便。External effect of internal arc fault test is a key factor of estimate of internal arc fault test of GIS/GIL.To estimated the external effect of internal arc fault test of GIS/GIL,a method of detect external effect is proposed,and an external effect detect device of GIS/GIL is developed.The device has validated by internal arc test of test object of many manufacturers.Furthermore,the detection of external effect time by using the proposed method is efficient and convenient.

关 键 词：内部电弧试验 GIS/GIL 检测 光敏元件 

分 类 号：TM501.2[电气工程—电器]