基于三参数威布尔函数法的光电器件寿命快速评估模型及其应用  

Rapid life assessment model of optoelectronic devices based on three-parameter Weibull function method and its applications

作　　者：张建平 张蓓 ZHANG Jianping;ZHANG Bei(College of Energy and Mechanical Engineering,Shanghai University of Electric Power,Shanghai 200090,China;School of Mechanical Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)

机构地区：[1]上海电力大学能源与机械工程学院,上海200090 [2]上海理工大学机械工程学院,上海200093

出　　处：《电子元件与材料》2021年第2期137-143,共7页Electronic Components And Materials

基　　金：国家自然科学基金(11572187);上海市科学技术委员会项目(18DZ1202105,18DZ1202302)。

摘　　要：针对光电器件实现产业化面临的可靠性问题,将亮度作为性能退化指标,开展了多组恒定应力下的加速退化试验。基于测试器件的亮度衰减数据,采用三参数威布尔函数和右逼近法并结合寿命与应力之间的内在联系构建了一种加速性能退化的寿命快速评估模型。以电子显示器件VFD为试验对象,计算了正常应力水平下的平均寿命,实现了模型的应用及精度评价。结果表明,设计的四组加速退化试验方案合理,寿命快速评估模型无需借助周期长的常规寿命试验便能快速地获得产品正常应力下的亮度变化轨迹及寿命信息,这对光电器件可靠性评估及产品质量管理有一定的指导意义。In allusion to the reliability problem faced by the industrialization of optoelectronic devices,a series of accelerated degradation tests were carried out under constant stresses by using luminance as the performance degradation index.Based on the luminance attenuation of the devices for the accelerated performance degradation,a rapid life assessment model was constructed by using three-parameter Weibull function and right approximation method and by considering the inherent relationship between life and stress.Taking electronic display device VFD for example,the average life span was calculated under normal stress level,and the application and accuracy evaluation of the model were achieved.The results show that the designed test scheme is reasonable by comparing four groups of accelerated degradation tests.The rapid life assessment model can quickly obtain the luminance change track and the life information of the products under normal stress without the help of long-term conventional life test.This method has a certain guiding significance for reliability evaluation and product quality management of optoelectronic devices.

关 键 词：光电器件 加速退化试验 寿命评估模型 亮度衰减 三参数威布尔函数 

分 类 号：TN141[电子电信—物理电子学] TN27