新生儿缺血缺氧性脑病血清eNOS、endostatin表达及其预后相关性分析  

Expression of serum e NOS and endostatin in neonatal hypoxic-ischemic encephalopathy and its correlation with prognosis

作　　者：张玲玲 才让卓玛 李永玲 ZHANG Ling-ling;CAIRang Zhuoma;LI Yong-ling(Department of Pediatrics,Second People's Hospital of Xining City,Qinghai Province,Xining 810003,Qinghai,China)

机构地区：[1]青海省西宁市第二人民医院儿科,青海西宁810003

出　　处：《中国优生与遗传杂志》2020年第12期1495-1498,共4页Chinese Journal of Birth Health & Heredity

基　　金：西宁市科学技术局,项目编号:2016-K-20。

摘　　要：目的探究新生儿缺血缺氧性脑病(HIE)中血清内皮型一氧化氮合酶(eNOS)、内皮抑素(endostatin)表达水平及其与预后相关性。方法选取2015年1月~2020年1月本院收治的HIE患儿97例作为观察组,另选取同期在本院体检显示健康且足月出生新生儿90例作为对照组。采用酶联免疫吸附(ELISA)法检测血清eNOS、endostatin、血管内皮生长因子(VEGF)表达水平;采用Pearson法进行HIE患儿血清eNOS、endostatin、VEGF表达水平相关性分析;采用Logistic回归模型进行HIE患儿发生不良预后影响因素分析。结果观察组患儿血清eNOS、endostatin、VEGF表达水平明显高于对照组,1 min Apgar评分、NBNA评分均明显低于对照组(P<0.05)。HIE患儿血清eNOS与endostatin、VEGF表达水平呈正相关(P<0.05),血清endostatin与VEGF表达水平呈正相关(P<0.05)。轻度组、中度组、重度组HIE患儿血清eNOS、endostatin、VEGF表达水平依次显著升高(P<0.05)。预后不良组患儿血清eNOS、endostatin、VEGF表达水平明显高于预后良好组(P<0.05)。血清eNOS、endostatin、VEGF高水平均是影响HIE患儿发生不良预后的危险因素(P<0.05)。结论HIE患儿血清endostatin、eNOS表达水平明显升高,二者间存在相互作用关系,在脑损伤和修复过程中发挥重要作用,可预示HIE患儿不良预后发生。Objective:To investigate the expression levels of serum endothelial nitric oxide synthase(eNOS)and endostatin(endostatin)in neonatal hypoxic ischemic encephalopathy(HIE)and their correlation with prognosis.Methods:97 cases of HIE children in our hospital from January 2015 to January 2020 were selected as the observation group,and 90 cases of healthy and full-term newborns were selected as the control group at the same time in our hospital physical examination.The expression of eNOS,endostatin and vascular endothelial growth factor(VEGF)was detected by Enzyme linked immunosorbent assay(ELISA);the correlation of serum eNOS,endostatin and VEGF expression levels in HIE children was analyzed by Pearson method;the influencing factors of adverse prognosis in HIE children was analyzed by Logistic regression model.Results:The expression levels of eNOS,endostatin and VEGF in the observation group were significantly higher than those in the control group,and the 1 minute Apgar score and NBNA score were significantly lower than those in the control group(P<0.05).Serum eNOS was positively correlated with the expression of endostatin and VEGF(P<0.05),and the expression of serum endostatin was positively correlated with VEGF(P<0.05).The levels of serum eNOS,endostatin and VEGF in mild group,moderate group and severe group of HIE children were significantly increased(P<0.05).The expression levels of eNOS,endostatin and VEGF in poor prognosis group were significantly higher than those in good prognosis group(P<0.05).The high level of serum eNOS,endostatin and VEGF were the risk factors of adverse prognosis in HIE children(P<0.05).Conclusion:The levels of serum endostatin and eNOS in HIE children are significantly increased,and there is an interaction between them,which plays an important role in the process of brain injury and repair,which can predict the occurrence of adverse prognosis in HIE children.

关 键 词：新生儿 缺血缺氧性脑病 内皮型一氧化氮合酶 内皮抑素 预后 

分 类 号：R722.1[医药卫生—儿科]