GaAs多功能MMIC在片测试系统设计  

Design of GaAs Multi-Function MMIC On-Wafer Test System

作　　者：陈金远[1] 焦芳[1] 王逸铭 林罡[1] CHEN Jinyuan;JIAO Fang;WANG Yiming;LIN Gang(Nanjing Electronic Device Institute,Nanjing 210016,China)

机构地区：[1]南京电子器件研究所,南京210016

出　　处：《电子与封装》2021年第3期32-35,共4页Electronics & Packaging

摘　　要：GaAs多功能MMIC集成度高,数模混合驱动及测试需求考验测试平台的兼容性和稳定性。采用PXI平台模块化测试仪器结合矢量网络分析仪设计多功能MMIC在片测试系统,满足GaAs多功能MMIC的数模混合信号驱动、检测需求,保证测试稳定性。GaAs multi-function MMIC is highly integrated.The test compatibility and stability of the test platform are required by mixed digital and analog drive and test requirements.The multi-function MMIC test system is designed by using PXI platform modular test instrument and vector network analyzer to meet the demand of mixed signal driving and detection of multi-function MMIC,ensure the stability of test.

关 键 词：多功能MMIC PXI 逻辑电路 模块化仪器 

分 类 号：TN45[电子电信—微电子学与固体电子学] TN407