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作 者:Teng-Da Xu Jian Xing Li-Tian Wang Jin-Li Zhang Sheng-Hui Zhao Yang Xiong Xin-Jie Zhao Lu Ji Xu Zhang Ming He 徐腾达;邢建;王荔田;张金利;赵生辉;熊阳;赵新杰;季鲁;张旭;何明(First Affiliation College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China;Key Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin,Tianjin 300350,China)
机构地区:[1]First Affiliation College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China [2]Key Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin,Tianjin 300350,China
出 处:《Chinese Physics B》2021年第1期640-640,共1页中国物理B(英文版)
摘 要:The rocking curve of Tl-2212 thin films in Fig.2 of our original paper[1]should be replaced with the following new one.Accordingly,in the fifth paragraph of Section 3 of the original paper,the statement“The full width at half maximum(FWHM)of the(0012)peak of the Tl-2212 phase is about 0.24°”should be“The full width at half maximum(FWHM)of the(0012)peak of the Tl-2212 phase is about 0.42°”.
关 键 词:Tl-2212 superconducting films POST-ANNEALING critical temperature critical current density
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