基于原位红外光谱技术的键合剂贮存老化规律及寿命研究  

Study on storage aging law and lifetime of bonding agent based on in-situ infrared spectroscopy technique

作　　者：罗毅坚[1] 李建军[1] 艾进[1] 彭强[1] 于谦[1] 陈捷[1] 银颖 睢贺良[1] Luo Yijian;Li Jianjun;Ai Jin;Peng Qiang;Yu Qian;Chen Jie;Yin Ying;Sui Heliang(Institute of Chemical Materials,China Academy of Engineering Physics,Mianyang 621900,China)

机构地区：[1]中国工程物理研究院化工材料研究所,四川绵阳621900

出　　处：《化学推进剂与高分子材料》2021年第1期59-62,共4页Chemical Propellants & Polymeric Materials

基　　金：国家自然科学基金(21703216)。

摘　　要：采用原位红外光谱技术开展键合剂在不同温度下的贮存老化规律及动力学研究,结果表明羟基为键合剂老化的薄弱环节。采用羟基官能团的变化规律进行动力学分析,得到活化能为117kJ/mol;以吸光度变化0.1%和1%作为贮存寿命的判据,键合剂在30℃下的贮存寿命分别为9.37a和93.7a。The storage aging law and the kinetics of the bonding agent at different temperatures were investigated by using the in-situ infrared spectroscopy technique.The results show that the hydroxyl group is the weak link of the bonding agent aging.The kinetics analysis was carried out by using the change law of hydroxyl functional group,it is obtained that the activation energy is 117kJ/mol.Using 0.1%and 1.0%of absorbance change as the criterion of the storage life,the storage lifetime of the bonding agent at 30℃is 9.37a and 93.7a respectively.

关 键 词：键合剂 原位红外光谱 老化规律 贮存寿命 

分 类 号：TQ560.72[化学工程—炸药化工]