原子力显微镜法测量氧化石墨烯厚度的研究  

Study on the thickness measurement of graphene oxide by atomic force microscopy

作　　者：张小敏 卜天佳 李倩 任玲玲[2] 董国材 Zhang Xiaomin;BuTianjia;Li Qian;Ren Lingling;Dong Guocai(Jiangsu Jiangnan Xiyuan Graphene Technology Go.,Ltd.,Changzhou 213000,China;National Institute of Metrology,Beijing 100029,China;China Metallurgical Information And Standardization Institute,Beijing 10Q730,China;Guocheng Instrument(Changzhou)Co.,Ltd.,Changzhou 213000,China)

机构地区：[1]江苏江南烯元石墨烯科技有限公司,江苏常州213100 [2]中国计量科学研究院,北京100209 [3]冶金工业信息标准研究院,北京100730 [4]国成仪器(常州)有限公司,江苏常州213100

出　　处：《冶金标准化与质量》2021年第1期18-24,共7页Metallurgical Standardization & Quality

摘　　要：准确测量氧化石墨烯厚度是氧化石墨婦研究、开发和应用中的核心科学问题。文章介绍了采用原子力显微镜(AFM)法,测量碳氧比不同的两种氧化石墨烯的形貌图,分别通过线性拟合法和概率统计法计算形貌图中氧化石墨烯的厚度。结果表明:碳氧比为2.44和1.15的氧化石墨烯厚度分别为0.74 mn,1.03 nm,扩展不确定度(k=2)分别为0.24 nm,0.22 nm。碳氧比为2.44的氧化石墨晞,其厚度值在0.5〜1.0 nm范围的样品为单层氧化石墨烯,厚度值1.5〜2.3 nm范围的样品为叠片氧化石墨烯。本研究有助于规范氧化石墨烯厚度的测量,为促进氧化石墨烯在应用领域的实用化提供理论支持和技术基础。Accurate measurement of the thickness of graphene oxide(GO)is an important scientific issue in the research,development and application of graphene oxide.In this paper,atomic force microscopy(AFM)was used to measure the morphology of two kinds of GO with different ratios of carbon to oxygen.The thickness of GO in the morphology was calculated by linear fitting method and probabilistic statistical method respectively.The results show that the thickness of GO with C/0 ratio of 2.44 and 1.15 is 0.74 nm,1.03 nm,respectively,and the extended uncertainties(k=2)is 0.24 nm and 0.22 nm,respectively.For GO with a G/0 ratio of 2.44,the samples with a thickness in the range of 0.5 nm to 1.0 nm was determined as monolayer GO,and the samples with a thickness in the range of 1.5 nm to 2.3 nm was determined as double layer GO.This study is helpful to standardize the thickness measurement of GO and provide theoretical support and technical basis for promoting the practical application of GO in the field of application.

关 键 词：厚度 原子力显微镜 碳氧比 线性拟合法 概率统计法 

分 类 号：TG115.21[金属学及工艺—物理冶金]