基于共线外差干涉的波片相位延迟的测量系统  

Measurement system of the wave plate phase delay based on collinear heterodyne interference

作　　者：周森 张志伟[1,2] 杨娅洲 ZHOU Sen;ZHANG Zhi-wei;YANG Ya-zhou(School of Information and Communication Engineering,North University of China,Taiyuan 030051,China;Key Laboratory of Electronic Testing Technology,North University of China,Taiyuan 030051,China)

机构地区：[1]中北大学信息与通信工程学院,山西太原030051 [2]中北大学电子测量技术重点实验室,山西太原030051

出　　处：《物理实验》2021年第3期11-15,共5页Physics Experimentation

基　　金：山西省自然基金资助项目(No.201701D121060)。

摘　　要：通过共线光外差系统对光波所携带相位信息的精密检测,以及对波片光轴在入射面内的不同方位时寻常光(即o光)和非常光(即e光)的传播特性的理解,搭建了共线光外差测量系统对波片的相位延迟进行测量.实验结果表明该测量方法的测量精度达到±0.5°,并通过对光线斜入射时波片相位延迟的检测对该方法进行了验证.Through the precise detection of the phase information by the collinear optical heterodyne system,and the understanding of the propagation characteristics of ordinary light and extraordinary light when the optical axis of the wave plate was in different directions in the incident plane,a collinear optical heterodyne measurement system was built to measure the phase delay of wave plate.The experimental results showed that the accuracy of this method was±0.5°.This method was verified by measuring the phase delay of wave plate when the light was in different incident angle.

关 键 词：相位延迟 波片测量 外差干涉 光轴 

分 类 号：O436.3[机械工程—光学工程] TN247[理学—光学]