热探测器低频性能测试系统电路设计与实现  

Circuit Design and Realization of Low Frequency Performance Test System for Thermal Detector

作　　者：程娟 Cheng Juan(Wuhan Instrument Electronic School,Wuhan Hubei 430000)

机构地区：[1]武汉市仪表电子学校,湖北武汉430000

出　　处：《现代工业经济和信息化》2021年第3期32-33,共2页Modern Industrial Economy and Informationization

摘　　要：首先介绍国内外各红外热探测器测试技术发展状况,概括热释电探测器和黑体辐射原理,然后根据设计需求确定热探测器低频性能参数测试系统的总体方案,设计并实现了斩波器电机控制电路和热探测器电路,并对各电路模块和整机进行了测试。This paper first introduces the development status of various infrared thermal detectors at home and abroad,summarizes the principle of pyroelectric detectors and black body radiation,and then determines the overall scheme of the thermal detector low-frequency performance parameter test system according to the design requirements,and designs And realized the chopper motor control circuit and heat detector circuit,and tested each circuit module and the whole machine.

关 键 词：热释电探测器 调制 放大电路 带通滤波器 

分 类 号：V423.6[航空宇航科学与技术—飞行器设计]