Research on Column FPN and Black Level Calibration in Large Array CMOS Image Sensor  

作　　者：GUO Zhongjie YU Ningmei WU Longsheng 

机构地区：[1]School of Automation and Information Engineering,Xi’an University of Technology,Xi’an 710048,China [2]Xi’an Microelectronic Technology Institute,Xi’an 710054,China

出　　处：《Chinese Journal of Electronics》2021年第2期268-274,共7页电子学报（英文版）

基　　金：supported by the National Natural Science Foundation of China(No.61771388);Scientific Research Project of Shaanxi Education Department(No.19JC029)。

摘　　要：A technical investigation,research and implementation is presented to correct column fixed pattern noise and black level in large array Complementary metal oxide semiconductor(CMOS)image sensor.Through making a comparison among reported solution,and give large array CMOS image sensor design and considerations,according to our previous analysis on non-ideal factor and error source of piecewise Digital to analog converter(DAC)in multi-channels,an improving accurate piecewise DAC with adaptive switch technique is developed.The research theory has verified by a high dynamic range and low column Fixed pattern noise(FPN)CMOS image sensor prototype chip,which consisting of 8320×8320 pixel array was designed and fabricated in 55 nm CMOS 1P4M standard process.The chip active area is 48 mm×48 mm with a pixel size of 5.7μm×5.7μm.The measured results achieved a high intrinsic dynamic range of 75 d B,a low FPN and black level of 0.06%,a low photo response non-uniformity of 1.5%respectively,and an excellent raw sample image taken by the prototype sensor.

关 键 词：CMOS image sensor Column FPN Readout chain DAC 

分 类 号：TN792[电子电信—电路与系统] TP212[自动化与计算机技术—检测技术与自动化装置]