基于光的等厚干涉的杨氏模量测定仪的设计  

Design of Young’ Smodulus Instrument Based on Equal Thickness Interference of Light

作　　者：谢谦 汤引生 XIE Qian;TANG Yin-sheng(College of Electronic Information and Electrical Engineering,Shangluo University,Shangluo 726000,Shaanxi)

机构地区：[1]商洛学院电子信息与电气工程学院,陕西商洛726000

出　　处：《商洛学院学报》2021年第2期1-4,共4页Journal of Shangluo University

基　　金：商洛学院教育教学改革重点研究项目(20jyjx103)。

摘　　要：针对目前实验室中杨氏模量测定仪存在的缺点,设计出了一种新的杨氏模量测定仪。该仪器装置由架台、光的干涉装置和读数显微镜构成,与原来仪器相比,由一端铰接的上下玻璃片代替了原来平面镜组成的光杠杆,读数显微镜代替了原来的尺度望远镜,这样就可以实现对钢丝杨氏模量的精确测量。该装置结构简单,易实现,同时提高了测量精度和测量效率,解决了现有技术中的问题。Aiming at the shortcomings of young’s modulus meter in the laboratory, a new young, s modulus meter was designed.The apparatus consists of a frame, a light interference device and a reading microscope. In contrast to the original instrument, the optical rod consisting of a flat mirror is replaced by a hinged upper and lower glass plate at one end, and a reading microscope is replaced by a scale telescope, enabling accurate measurement of young’s modulus of rigor. The structure of the device is simple and easy to realize. At the same time, the measuring accuracy and efficiency are improved. The proplem are solved in the prior.

关 键 词：等厚干涉 杨氏模量测定仪 光 

分 类 号：O4-34[理学—物理]