集成电路的通用单粒子效应测试系统设计  

Design of a general test system for integrated circuit Single Event Effect

作　　者：杨婉婉 刘海南[1,2] 高见头 罗家俊[1,2] 滕瑞 韩郑生[1,2,3] YANG Wanwan;LIU Hainan;GAO Jiantou;LUO Jiajun;TENG Rui;HAN Zhengsheng(Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China;Key Laboratory of Silicon Device Technology,Chinese Academy of Sciences,Beijing 100029,China;School of Microelectronics,University of Chinese Academy of Sciences,Beijing 100029,China)

机构地区：[1]中国科学院微电子研究所,北京100029 [2]中国科学院硅器件技术重点实验室,北京100029 [3]中国科学院大学微电子学院,北京100029

出　　处：《太赫兹科学与电子信息学报》2021年第2期347-351,360,共6页Journal of Terahertz Science and Electronic Information Technology

摘　　要：为满足种类繁多、功能复杂集成电路的单粒子效应评估需求,克服目前国内地面单粒子辐照实验环境机时紧张、物理空间有限等方面的限制,设计实现了一款高效通用的集成电路单粒子效应测试系统。创新性地采用旋转立体垂直结构,包含一个多现场可编程门阵列(FPGA)电测试平台、运动控制分系统和被测器件装载板。便携式箱体结构仅需3个DB9接口即可完成所有与外界连线;基于LabVIEW实现上位机交互界面,界面友好;基于多FPGA平台实现下位机测试程序,灵活可扩展,通用性强。可实现8种300及以下管脚集成电路的一次安装、自动切换和10°~90°的角度辐射。实时监控并后台记录翻转数据、翻转时间、电路状态等细节信息,测试频率可达100 MHz。已通过专用集成电路(ASIC)、静态随机存取存储器(SRAM)、控制器局域网络(CAN)接口电路等集成电路的多次实测,验证了该系统的可靠性及其高效稳定、集成度高、安装调试方便等特点。In order to meet the requirements of Single Event Effect(SEE)evolution for a wide variety of integrated circuits with complex functions and overcome the limitations such as time constraints and limited physical space in current domestic ground single event irradiation experimental environment,an efficient and universal single event effect test system is designed and implemented for integrated circuits,which innovatively adopts rotating solid vertical structure,including a multi-Field Programmable Gate Array(FPGA)electrical test platform,a motion control subsystem and some loading boards of the Devices Under Test(DUT).The entire test system is packaged as a portable box,which only needs three DB9 interfaces to complete all connections with the outside world.Therein the PC interface is achieved based on LabVIEW,friendly to users.The lower computer test program is implemented based on the multi-FPGA platform,which is flexible,extensible and versatile.It can realize one-time installation,automatic switching and angle radiation test of 8 types of integrated circuits within 300 PINs,meanwhile monitor in real-time and background record the detail information such as flip data,flip time,circuit status and so on,whose test frequency achieves 100 MHz.The reliability,efficiency,stability,high integration,and convenient installation and debugging have been verified by multiple tests on Application Specific Integrated Circuit(ASIC),Static Random-Access Memory(SRAM),Controller Area Network(CAN)interface circuit and other integrated circuits.

关 键 词：单粒子效应测试系统 旋转结构 角度辐射 虚拟仪器 

分 类 号：TN710[电子电信—电路与系统]