可靠性增长试验中抗振恒温晶振失效案例分析  

Failure Case Analysis of Anti-vibration OCXO in Reliability Growth Test

作　　者：龚小维 GONG Xiaowei(Southwest China Institute of Electronic Technology,Chengdu 610036,China)

机构地区：[1]中国西南电子技术研究所,四川成都610036

出　　处：《电子产品可靠性与环境试验》2021年第2期47-52,共6页Electronic Product Reliability and Environmental Testing

摘　　要：随着航天技术的发展,对飞行器中电子设备的小型化和可靠性指标均提出了较高的要求,而晶振作为电子设备中不可或缺的基本单元,对其体积和抗振性设计也提出了更高的要求。某飞行器载小型化通信设备在研制过程中通过可靠性增长试验暴露出了超小型抗振恒温晶振失效的潜在故障,对该晶振的减振原理及故障机理进行了分析,提出了改进措施并进行了仿真和试验验证,最终达到了提升小型化通信设备的可靠性指标的目标,对于提高类似航天电子产品的可靠性设计水平具有一定的参考意义。With the development of aerospace technology,higher requirements have been put forward for the miniaturization and reliability of electronic equipment in aircraft,and crystal oscillator is an indispensable basic unit in electronic equipment,so higher requirements also have been put forward for its volume and vibration resistance design.The potential failure of the ultra-small anti-vibration OCXO is exposed through the reliability growth test during the development process of a flight-borne miniaturized communication equipment.The principle of vibration reduction and failure mechanism of the crystal oscillator are analyzed,improvement measures are proposed,and simulation and experimental verification are carried out.Finally,the goal of improving the reliability index of miniaturized communication equipment is achieved,which has certain reference significance for improving the reliability design level of similar aerospace electronic products.

关 键 词：可靠性增长试验 恒温晶振 动态相噪 

分 类 号：TN752[电子电信—电路与系统]