基于STM32的重金属离子测量系统研究与设计  

Research and Design of Heavy Metal Ion Measurement System Based on STM32

作　　者：韩团军[1] 郑争兵[1] 燕亮 薛泽臣 HAN Tuanjun;ZHENG Zhengbing;YAN Liang;XUE Zechen(Shaanxi University of Technology,Physics and Telecommunications Engineering Dept,Hanzhong Shaanxi 723000,China)

机构地区：[1]陕西理工大学物理与电信工程学院,陕西汉中723000

出　　处：《电子器件》2021年第2期411-416,共6页Chinese Journal of Electron Devices

基　　金：国家自然科学基金项目(61972239,61772398);陕西省重点研发计划项目(2019SF-257);汉台区科学技术计划项目(2019KX-21);陕西理工大学科研项目(SLGKY2013)。

摘　　要：为了解决传统方法检测重金属离子浓度设备体积大,应用复杂、时间长等问题,提出了一种基于STM32的重金属离子测量系统。系统由控制模块、氧化还原电位传感器模块、复合电极、显示模块等组成。对采集的数据ORP氧化还原电位和PT1000所测温度的各个关键点进行分析比较。利用SD卡存储金属离子在不同温度、不同浓度下的数据,以此作为标准值。采用五点校准法模拟金属离子随温度变化的曲线,消除温度对其测量带来的误差。采集不同温度下的ORP电位,提出卡方校验思想衡量实际值与理论值的差异程度,选取最优判断。最后进行测试实验,结果证明该系统工作可靠精度较高,可以在相关环境部门和工业部门进行推广。In order to solve the problems of large volume, complicated application and long time for the traditional method for detecting heavy metal ion concentration equipment. A heavy metal ion measurement system based on STM32 is proposed. The system consists of a control module, a redox potential sensor module, a composite electrode, and a display module. Analyze and compare the key points of the collected data ORP oxidation-reduction potential and the temperature measured by PT1000. Use the SD card to store the data of metal ions at different temperatures and different concentrations as a standard value. The five-point calibration method is used to simulate the curve of metal ions with temperature to eliminate the error caused by temperature on its measurement. Collect ORP potentials at different temperatures, put forward the chi-square calibration idea to measure the difference between the actual value and the theoretical value, and select the best judgment. Finally, a test experiment is conducted, and the results prove that the system has high reliability and accuracy, and can be promoted by relevant environmental departments and industrial departments.

关 键 词：金属离子浓度 电位传感器 复合电极 校准法 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]