试论集成电路失效分析中电测试的应用  

On the application of electrical test in IC failure analysis

作　　者：周长 Zhou Chang(Guangzhou Mechanical and electrical senior technical school,Guangzhou Guangdong,510000)

机构地区：[1]广州市机电高级技工学校,广东广州510000

出　　处：《电子测试》2021年第8期106-107,共2页Electronic Test

摘　　要：电测试是对集成电路进行失效分析的重要内容之一,在集成电路失效分析测试中具有十分重要的作用,采用合理的电测试方式,可以简化集成电路的失效分析过程,提高失效分析的测试效率。通过对集成电路失效分析的基本方法进行分析,探究了集成电路失效分析中仪器设备的具体应用,并分析了集成电路的印刷电路的失效性能。Electrical testing is one of the important contents of failure analysis for integrated circuits,which plays a very important role in the failure analysis and testing of integrated circuits.Adopting a reasonable electrical testing method can simplify the failure analysis process of integrated circuits and improve the test efficiency of failure analysis.Through the analysis of the basic methods of integrated circuit failure analysis,this paper explores the specific application of instruments and equipment in integrated circuit failure analysis,and analyzes the failure performance of printed circuit of integrated circuit.

关 键 词：集成电路 失效分析 电测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]