IEC 61967系列-集成电路辐射发射测试方法分析  

IEC 61967 Series-Analysis on Radiated Emission Tests Methods of Integrated Circuits

作　　者：王文杰 白云 彭俊 贾云霞 李腾飞 WANG Wen-jie;BAI Yun;PENG Jun;JIA Yun-xia;LI Teng-fei(Henan CAERI Vehicle Inspection&Certification Center Co.,Ltd.)

机构地区：[1]河南凯瑞车辆检测认证中心有限公司

出　　处：《中国集成电路》2021年第5期69-73,共5页China lntegrated Circuit

摘　　要：本文介绍了国际标准IEC 61967系列标准中关于集成电路辐射发射测量方法。同时,对标准给出的TEM小室和GTEM小室法、表面扫描法、IC带状线法的测试原理,试验布置及测试方法的特点进行了说明,以帮助测试人员根据不同种类的IC进行选择相应的试验方法。The integrated circuit electromagnetic radiated emission series standards IEC 61967 are introduced briefly.The test fundamentals,set up and attentions during test of these four different methods for immunity tests TEM cell and wideband TEM cell method,Surface scan method,IC stripline method are analyzed.Differences between these four methods are proposed for testers to choose the test program which is depend on the IC characteristics.

关 键 词：集成电路 TEM小室 GTEM小室 表面扫描法 IC带状线法 

分 类 号：TN03[电子电信—物理电子学] TN40