低压综合配电箱温升影响因素研究  

Research on Influencing Factors of Temperature Rise ofLow-Voltage Integrated Distribution Box

作　　者：贾晓明 戴建卓 贾勇勇 金心如 韩侃 JIA Xiao-ming;DAI Jian-zhuo;JIA Yong-yong;JIN Xin-ru;HAN Kan(State Grid Jiangsu Electric Power Company Maintenance Branch,Nanjing 211103,China;State Grid Jiangsu Electric Power Company Research Institute,Nanjing 211103,China;Suzhou Electrical Apparatus Science Research Institute Co.,Ltd,Suzhou 215104,China)

机构地区：[1]国网江苏省电力有限公司检修分公司,江苏南京211103 [2]国网江苏省电力有限公司电力科学研究院,江苏南京211103 [3]苏州电器科学研究院股份有限公司,江苏苏州215104

出　　处：《电工电气》2021年第5期37-40,51,共5页Electrotechnics Electric

摘　　要：通过对低压综合配电箱(JP柜)的质量抽检,发现其温升试验不合格率较高,一旦温升超过限值将影响设备安全稳定运行。对不同供应商的JP柜开展了温升试验,比较了JP柜空间布局、塑壳断路器型号、母排结构尺寸等方面差异,分析了JP柜中塑壳断路器的温升超标原因,对JP柜中塑壳断路器选用及结构优化等方面提出了相关建议。Through the quality inspection of the low-voltage integrated distribution box also called JP cabinet,it is found that the temperature rise test has a high unqualified rate.Once the temperature rise exceeds the limit,the safe and stable operation of the equipment will be affected.The author carried out temperature rise tests on JP cabinets from different suppliers,compared the differences in JP cabinet space layout,molded case circuit breaker model,busbar structure size,etc.,and analyzed the reasons for the excessive temperature rise of the molded case circuit breaker in the JP cabinet.Relevant suggestions are put forward for the selection and structural optimization of molded case circuit breakers in JP cabinets.

关 键 词：低压综合配电箱(JP柜) 塑壳断路器 温升试验 

分 类 号：TM594[电气工程—电器]