Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials  

作　　者：Zhiya Dang Yuqing Luo Xue-Sen Wang Muhammad Imran Pingqi Gao 党志亚;罗余庆;王学森;Muhammad Imran;高平奇(School of Materials,Sun Yat-sen University,Guangzhou 510006,China;Department of Physics,National University of Singapore,Singapore 117551,Singapore;Department of Nanochemistry,Istituto Italiano di Tecnologia,Via Morego 30,Genova 16163,Italy)

机构地区：[1]School of Materials,Sun Yat-sen University,Guangzhou 510006,China [2]Department of Physics,National University of Singapore,Singapore 117551,Singapore [3]Department of Nanochemistry,Istituto Italiano di Tecnologia,Via Morego 30,Genova 16163,Italy

出　　处：《Chinese Optics Letters》2021年第3期8-12,共5页中国光学快报（英文版）

基　　金：supported by the Recruiting Program of Sun Yatsen University in China (No. 76180-18841225);the funding from the European Union under grant agreement No. 614897 (ERC Grant TRANS-NANO)。

摘　　要：The instability of lead halide perovskites in various application-related conditions is a key challenge to be resolved. We investigated the formation of metal nanoparticles during transmission electron microscopy(TEM) imaging of perovskite-related metal halide compounds. The metal nanoparticle formation on these materials originates from stimulated desorption of halogen under electron beams and subsequent aggregation of metal atoms. Based on shared mechanisms,the TEM-based degradation test can help to evaluate the material stability against light irradiation.

关 键 词：halide perovskite TEM DEGRADATION electronic transition stimulated desorption 

分 类 号：TB383.1[一般工业技术—材料科学与工程]