胚胎电子细胞剩余码/berger码联合编码自检方法  

A residue codes and berger codes combined coding self-check method for embryonic electronic cell

作　　者：王博 孟亚峰 WANG Bo;MENG Yafeng(Department of Electronic and Optical Engineering,Army Engineering University,Shijiazhuang 050003,China)

机构地区：[1]陆军工程大学石家庄校区电子与光学工程系,石家庄050003

出　　处：《北京航空航天大学学报》2021年第4期875-884,共10页Journal of Beijing University of Aeronautics and Astronautics

基　　金：国家自然科学基金(61372039)。

摘　　要：为了更好地实现胚胎电路的自检需求,针对地址产生模块和输入输出模块,基于基本逻辑和算术运算中操作数和结果数之间的剩余码和berger码关系,对胚胎电子细胞输入输出等价运算的构建进行了讨论分析。通过剩余码检测单个故障,berger码检测多位单向故障,设计了一种剩余码/berger码联合编码的胚胎电子细胞自检方法。给出了所提方法的流程和实现方法,分析了基于所提方法设计的胚胎电子细胞的故障检测率、自检模块自检率和硬件资源消耗。以时序逻辑电路为目标电路进行了仿真实验,验证了所提方法对胚胎电子细胞各模块的检测能力和对检测模块的自检能力。According to embryonic electronic cell self-check demand,the residue code and berger code relationships between operands and results are analyzed based on basic logic and arithmetic operations.Aimed at address generator and I/O router,embryonic electronic cell equality operation is analyzed between inputs and outputs.With single fault detected by residue code and multiple bits unidirectional fault detected by berger code,a residue and berger combined coding self-check method is proposed.The process and realization of the proposed method are presented,and the checker is designed.Embryonic electronic cell fault detection rate,self-detection rate and hardware resource consumption based on the proposed method are analyzed.A simulation experiment is presented based on a sequential logic circuit to verify fault detection ability and self-check ability of the proposed method to various modules of embryonic electronic cell.

关 键 词：胚胎电子 剩余码 自检测 在线故障检测 自修复 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]