相控阵雷达系统的BIT设计和故障诊断方法  

The BIT design and method of diagnosing faults of phased-array radar

作　　者：苏洲阳 Su Zhouyang(No.20th Research Institute of China Electronics Technology Group Corporation,Xi’an 710068,China)

机构地区：[1]中国电子科技集团公司第二十研究所,西安710068

出　　处：《电子测量技术》2021年第4期172-176,共5页Electronic Measurement Technology

摘　　要：良好的机内测试(BIT)设计和合理的故障诊断方法选择能够有效提升相控阵雷达系统的故障检测和诊断能力。本文阐述了雷达系统BIT设计的基本思路,针对某多功能相控阵雷达的基本组成和功能特点,设计了集中控制和分级检测相结合的分布式BIT结构以及相应的BIT工作流程,并且介绍了不同故障诊断方法的选择依据。通过基于故障注入的实验验证,该雷达BIT系统的故障检测率≥95%,故障隔离率≥90%(隔离到3个LRU),≥85%(隔离到1个LRU),故障虚警率≤5%,满足雷达总体的要求,结果证明了该雷达BIT设计的有效性。最后展望了未来相控阵雷达系统故障检测与诊断技术发展的重点方向。The good design of built in test(BIT) and fault diagnosis is an important way to achieve the better testability and maintainability of phased array radar. This paper presents the basic idea of BIT design of radar system. Aim at the composition and function of a multi-functional phased array radar, This paper designed a distributed BIT structure combining centralized control and hierarchical detection and the corresponding BIT workflow, and the selection basis of different fault diagnosis methods. Through the experimental verification based on fault injection, the fault detection rate of the radar BIT system is greater than 95%, the fault isolation rate is greater than 90% in the case of isolation to 3 LRU, greater than 85% in the case of isolation to 1 LRU, and the fault false alarm rate is greater than 5%, which meets the overall requirements and proves the effectiveness of the design of the BIT. At last, it looks forward to the improvement direction of on-line testing and fault diagnosis technology in the phased array radar system.

关 键 词：相控阵雷达 机内测试 故障诊断 

分 类 号：TN952[电子电信—信号与信息处理]