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作 者:李芳 焦继业 马彩彩 Li Fang;Jiao Jiye;Ma Caicai(College of Electronic Engineer,Xi′an University of Posts and Telecommunications,Xi′an 710000,China)
机构地区:[1]西安邮电大学电子工程学院,陕西西安710121
出 处:《电子技术应用》2021年第6期35-39,共5页Application of Electronic Technique
摘 要:介绍了基于HVCMOS工艺的低成本、高集成度、强驱动性能功率集成电路(Power IC,PIC)H桥的设计实现。建立的金属互连线评估模型可在设计早期对H桥物理版图方案进行优差性判断,不依赖设计后仿真,从而提高设计效率。H桥不同互连线设计方案的比较结果表明,多插指阵列器件互连线(M2及以上层金属)与器件本体的金属层M1垂直、梯形状互连结构,能够提高互连线沿电流流向的有效长宽比,减小寄生电阻。The design and realization of a H-bridge which is power integrated circuit(Power IC,PIC)and based on the HVCMOS process with low cost,high integration and strong driving performance is introduced.The established metal interconnection evaluation model can judge the H-bridge physical layout in the early stage of the design and does not rely on post-design simulation,thereby improving design efficiency.The comparison result of different interconnection design of H-bridge shows that the interconnection of multi-finger array device(M2 layer and above metal)is perpendicular to the metal layer M1 of the device and ladder-shaped structure can improve the effective aspect ratio of the interconnection along the current flow direction,thus reduce parasitic resistance.
分 类 号:TN492[电子电信—微电子学与固体电子学]
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