便携式差分喇曼光谱技术在翡翠鉴定中的研究  

Study on shifted-excitation Raman difference spectroscopy in the identification of jade

作　　者：于爽 夏婧竹 YU Shuang;XIA Jingzhu(Nanjing Jianzhi Instrument an Equipment Co. Ltd.,Nanjing 210049,China)

机构地区：[1]南京简智仪器设备有限公司,南京210049

出　　处：《激光技术》2021年第4期511-515,共5页Laser Technology

摘　　要：为了实现对翡翠种属及注胶翡翠的鉴定,采用显微联用位移激发差分喇曼光谱法进行了理论分析与实验验证,得到了112个翡翠样品的差分喇曼光谱数据,比较了翡翠的差分喇曼光谱和普通喇曼光谱,并统计分析了翡翠的喇曼特征峰及B货翡翠的鉴别依据。结果表明,差分喇曼可有效滤除荧光,对识别高荧光翡翠样品的特征峰有显著优势;378cm^(-1),698cm^(-1),1037cm^(-1)峰强较强、峰形尖锐,是检测翡翠时出现频率最高特征峰,可以借此对样品种属进行鉴定;通过显微放大能观察到B货翡翠经酸洗产生的裂纹、凹坑及其充填的有机物,并在此处可检测到有机物的喇曼特征峰,其中1114cm^(-1),1188cm^(-1),1611cm^(-1)出现最为频繁,可以此对翡翠的A货、B货进行鉴定。该方法操作简单、提高鉴定效率,可为翡翠的快速鉴定提供参考。In order to realize the identification of jadeite species and rubber-injected jadeite,theoretical analysis and experimental verification were carried out by using microscope combined with shifted-excitation Raman difference spectroscopy(SERDS),and SERDS data of 112 jadeite samples were obtained.The SERDS and ordinary Raman spectrum of jade were compared,and the Raman characteristic peaks of jade and the identification basis of B jade were statistically analyzed.The results show that the SERDS can effectively filter out the fluorescence and has a significant advantage in identifying the characteristic peaks of high-fluorescence jadeite samples.The peaks at 378cm^(-1),698cm^(-1),and 1037cm^(-1) are relatively strong and have sharp peak shapes.They are the characteristic peaks with the highest frequency when detecting jadeite,which can be used to identify sample species.The cracks,pits and the organic matter filled by the pickling of the B jadeite can be observed by microscopic magnification.The Raman characteristic peaks of the organic matter can be detected here,of which 1114cm^(-1),1188cm^(-1),1611cm^(-1) appear most frequently,jade goods A and B can be identified through this method is simple to operate and the identification efficiency can be improved.This method can provide a reference for the rapid identification of jadeite.

关 键 词：光谱学 鉴别 位移激发差分喇曼光谱 翡翠 

分 类 号：O433[机械工程—光学工程]