纠缠光子对的级联Hong-Ou-Mandel干涉研究及其在多时延参数测量中的应用  

Cascaded Hong-Ou-Mandel interference of entangled photon pairs and its application in multiple delay parameters measurement

作　　者：翟艺伟 董瑞芳[2,3] 权润爱 项晓[2,3] 刘涛[2,3] 张首刚 Zhai Yi-Wei;Dong Rui-Fang;Quan Run-Ai;Xiang Xiao;Liu Tao;Zhang Shou-Gang(School of Electrical and Control Engineering,Shaanxi University of Science&Technology,Xi’an 710021,China;Key Laboratory of Time and Frequency Primary Standards,National Time Service Center,Chinese Academy of Sciences,Xi’an 710600,China;School of Astronomy and Space Science,University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]陕西科技大学电气与控制工程学院,西安710021 [2]中国科学院国家授时中心,时间频率基准重点实验室,西安710600 [3]中国科学院大学天文与空间科学学院,北京100049

出　　处：《物理学报》2021年第12期22-29,共8页Acta Physica Sinica

基　　金：国家自然科学基金(批准号:12033007,61875205,61801458,91836301);中国科学院前沿科学重点研究项目(批准号:QYZDBSW-SLH007);中国科学院战略性先导科技专项C类项目(批准号:XDC07020200);中国科学院“西部青年学者”项目(批准号:XAB2019B17,XAB2019B15);中国科学院重点项目(批准号:ZDRW-KT-2019-1-0103)资助的课题;广东省重点研发项目(批准号:2018B030325001)。

摘　　要：基于纠缠光子对的Hong-Ou-Mandel(HOM)干涉仪在量子精密测量等领域有着重要应用.本文提出了利用一个级联HOM干涉仪实现多个独立时延参数的同时测量方案.通过理论分析得出纠缠光子对经过多个50:50分束器级联传输后,其HOM二阶量子干涉图谱中凹陷位置与各级传输路径间独立时延参数的对应关系,因此可通过记录各个凹陷位置的时延值实现多个独立时延参数的同时测量.在此基础上搭建了基于频率一致纠缠光子对的二级级联HOM干涉测量装置,通过实验上得到的具有两个对称凹陷的二阶量子干涉图谱,实现了两级传输路径间两个独立时延参数τ1和τ2的同时测量,并分别获得了109 fs和98 fs的测量精度.上述研究结果为HOM干涉仪在多参量量子精密测量系统中的扩展应用奠定基础.The Hong-Ou-Mandel(HOM)interferometer using entangled photon source possesses important applications in quantum precision measurement and relevant areas.In this paper,a simultaneous measurement scheme of multiple independent delay parameters based on a cascaded HOM interferometer is proposed.The cascaded HOM interferometer is composed of n concatenated 50:50 beam splitters and independent delay parametersτ1,τ2,…,τn.The numbers n=1,2 and 3 refer to the standard HOM interferometer,the secondcascaded HOM interferometer,and the third-cascaded HOM interferometer,respectively.Through the theoretical study of the cascaded HOM interference effect based on frequency entangled photon pairs,it can be concluded that there is a corresponding relationship between the dip position and the independent delay parameter in the second-order quantum interferogram.In the standard HOM interferometer,there is a dip in the second-order quantum interferogram,which can realize the measurement of delay parameterτ1.In the second-cascaded HOM interferometer,there are two symmetrical dips in the second-order quantum interferogram,which can realize the simultaneous measurement of two independent delay parametersτ1 andτ2.By analogy,in the third-cascaded HOM interferometer,there are six symmetrical dips in the second-order quantum interferogram,which can realize the simultaneous measurement of three independent delay parametersτ1,τ2 andτ3.Therefore,multiple independent delay parameters can be measured simultaneously based on a cascaded HOM interferometer.In the experiment,the second-cascaded HOM interferometer based on frequency entangled photon source is built.The second-order quantum interferogram of the second-cascaded HOM interferometer is obtained by the coincidence measurement device.Two independent delay parametersτ1 andτ2 are measured simultaneously by recording the positions of two symmetrical dips,which are in good agreement with the theoretical results.At an averaging time of 3000 s,the measurement accuracy of two delay pa

关 键 词：Hong-Ou-Mandel干涉仪 纠缠光子对 多时延参数 同时测量 

分 类 号：O431.2[机械工程—光学工程]