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作 者:Wei Chen Cui Xiaole Cui Xiaoxin Feng Xu Jin Yufeng
机构地区:[1]Key Laboratory of Integrated Microsystems,Peking University Shenzhen Graduate School,Shenzhen 518055,China [2]Institute of Microelectronics,Peking University,Beijing 100871,China [3]Artificial Intelligence Research Center,Peng Cheng Laboratory,Shenzhen 518055,China
出 处:《The Journal of China Universities of Posts and Telecommunications》2021年第2期1-13,共13页中国邮电高校学报(英文版)
基 金:supported in part by the Key-Area Research and Development Program of Guangdong Province(2019B010155002);the National Key Research and Development Project(2018YFB2202600);the Research and Development Project of Shenzhen Government(ZDSYS201802061805105).
摘 要:Through-silicon via(TSV)is a key enabling technology for the emerging 3-dimension(3 D)integrated circuits(ICs).However,the crosstalk between the neighboring TSVs is one of the important sources of the soft faults.To suppress the crosstalk,the Fibonacci-numeral-system-based crosstalk avoidance code(FNS-CAC)is an effective scheme.Meanwhile,the self-repair schemes are often used to deal with the hard faults,but the repaired results may change the mapping between signals to TSVs,thus may reduce the crosstalk suppression ability of FNS-CAC.A TSV self-repair technique with an improved FNS-CAC codec is proposed in this work.The codec is designed based on the improved Fibonacci numeral system(FNS)adders,which are adaptive to the health states of TSVs.The proposed self-repair technique is able to suppress the crosstalk and repair the faulty TSVs simultaneously.The simulation and analysis results show that the proposed scheme keeps the crosstalk suppression ability of the original FNS-CAC,and it has higher reparability than the local self-repair schemes,such as the signal-switching-based and the signal-shifting-based counterparts.
关 键 词:through-silicon via(TSV) build-in self-repair(BISR) crosstalk avoidance code(CAC) Fibonacci number
分 类 号:TN405[电子电信—微电子学与固体电子学]
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