基于微波光子晶体缺陷模特性的材料介电损耗测量方法  

Dielectric loss measurement method based on defect modeling of microwave photonic crystal

作　　者：梅永[1] 庄建军 王刚 乔欣然 Mei Yong;Zhuang Jianjun;Wang Gang;Qiao Xinran(Engineering Training Center,Nanjing University of Information Science and Technology,Nanjing 210044,China;School of Electronic and Information Engineering,Nanjing University of Information Science and Technology,Nanjing 210044,China)

机构地区：[1]南京信息工程大学工程训练中心,南京210044 [2]南京信息工程大学电子与信息工程学院,南京210044

出　　处：《电子测量技术》2021年第6期156-159,共4页Electronic Measurement Technology

摘　　要：为了精准测量电子材料在特定微波工作频率的介电损耗,提出一种基于微波光子晶体缺陷模特性的材料介电损耗测量方法。利用缺陷微波光子晶体结构的微波局域特性,将被测材料设计为微波光子晶体的缺陷层结构;采用传输矩阵方法计算和模拟了缺陷透射峰值与被测材料介电损耗之间的关系。结果表明,被测材料的介电损耗因数与缺陷透射峰值呈显著的单值函数关系,当介电损耗因数从0增加到1.0时,缺陷透射峰值从1.0降低到0.21。因此,通过实验检测到被测材料缺陷透射峰值后,利用所建立的材料损耗因数与透射峰值之间的关系,可以非常灵敏地反演出被测材料的介电损耗。In order to accurately measure the dielectric loss of electronic materials at a specific microwave frequency,a dielectric loss measurement method based on the defect model of microwave photonic crystal is proposed.Considering the microwave energy localization of the defective microwave photonic crystal,the dielectric under test is designed to be a defect layer within the microwave photonic crystal.The monotonic relationship between the transmission defect peak value and dielectric loss factor of the measured material is calculated by using transfer matrix method.When the dielectric loss factor varies from 0 to 1.0,the defect transmission peak value reduces from 1.0 to 0.21.As a result,when the defect transmission peak value is tested,and the dielectric loss factor can be obtained by using the calculated relationship between the transmission defect peak value and dielectric loss factor.

关 键 词：微波光子晶体 介电损耗 传输矩阵 缺陷模 

分 类 号：TP301[自动化与计算机技术—计算机系统结构]