侧面釉微裂纹对氧化锌压敏电阻片电气性能影响的探究  

Influence of Side Glaze Micro-Cracks on Electrical Properties of Zinc Oxide Varistors

作　　者：朱成洋 田冰 郭向洋 ZHU Chengyang;TIAN Bing;GUO Xiangyang(Jinguan Electric Co.,Ltd.,Nanyang 473000,China)

机构地区：[1]金冠电气股份有限公司,河南南阳473000

出　　处：《电瓷避雷器》2021年第3期156-161,共6页Insulators and Surge Arresters

摘　　要：有机环氧釉层弹性差,受热后与氧化锌压敏电阻片的膨胀系数难以匹配,在2 ms方波或4/10μs冲击后易在侧面釉层形成微裂纹。通过对微裂纹电阻片的方波冲击测试、加速老化、浸水、恒温恒湿、重复电荷转移、芯组水煮等实验验证,侧面微裂纹对电阻片的电气性能并未产生影响。The organic epoxy glaze has poor elasticity,which is difficult to match the expansion coefficient of zinc oxide varistor after heating. It is easy to form micro-cracks on the side glaze after 2 ms square wave or 4/10 μs impact. Through the square wave impact test,accelerated aging,water immersion,constant temperature and humidity,repeated charge transfer,core group boiling and other experiments on the resistors with micro-cracks,it is proved that the side micro-cracks do not affect the electrical properties of zinc oxide varistor.

关 键 词：有机环氧釉 微裂纹 电气性能 

分 类 号：TM862[电气工程—高电压与绝缘技术]