基于模拟和平滑方法的弱信号统计涨落评估与应用  

Evaluation and Application for Statistical Fluctuation of a Weak Signal Based on the Method of Simulation and Smoothing

作　　者：甫跃成[1] 胡孟春[1] 唐登攀[1] 易龙涛 刘建[1] 李忠宝[1] FU Yue-cheng;HU Meng-chun;TANG Deng-pan;YI Long-tao;LIU Jian;LI Zhong-bao(Institute of Nuclear Physics and Chemistry»China Academy of Engineering Physics,Mianyang 621900»China)

机构地区：[1]中国工程物理研究院核物理与化学研究所,四川绵阳621900

出　　处：《核电子学与探测技术》2020年第5期793-798,共6页Nuclear Electronics & Detection Technology

摘　　要：较低强度脉冲辐射测量中,基于经典理论的统计涨落表征和计算方法重点关注的往往只是探测器的统计涨落,评估时有较多的简化和假设,且需要用到许多难以可靠获得的参量,评估结果与实际情况可能存在不可避免的差异。依据统计涨落的基本表征方法,采用模拟标定与信号数据平滑处理相结合的方法对测试系统输出信号统计涨落进行表征,分析和实例应用表明:模拟标定可以将与测试系统输出信号统计涨落相关的绝大部分因素都体现在测量信号样本数据中,适当的数据平滑处理可以将不同时刻、不同幅度对应的统计涨落全过程表征出来。两者结合是一种便捷、直观且更接近真实情况的统计涨落评估方法,可为较低强度脉冲辐射测量中测试系统的设计和测量结果的统计涨落分析提供直接参考。In the measurement of weak pulsed radiation,as a rule,the characterization and calculating method for statistical fluctuation based on classical theory pay attention to only the fluctuation of detectors.There may be a unavoidable difference between the evaluation result and the ac-tual situation,since many simplifications and assumptions are performed and many prerequisite parameters are difficult to obtain dependably.In this work,the statistical fluctuation of the signal put out by the measuring system was characterized with the method of simulative calibration and data smoothing.As is shown in the analysis and the practical application,through simulative calibration,sample data which contain influences of most factors in statistical fluctuation of the signal put out by the measuring system can be gotten;after appropriate data smoothing,the statistical fluctuation of the whole waveform can be characterized integrally.It is a facile and practical meth-od for characterizing statistical fluctuation to integrate simulation and smoothing.Direct reference can be provided for designing measuring system and analyzing statistical fluctuation in the measurement of weak pulsed radiation.

关 键 词：统计涨落 不确定度 辐射探测 闪烁探测器 探测效率 

分 类 号：TL812[核科学技术—核技术及应用] O78[理学—晶体学]