像差校正高分辨原子像的皮米精度定量计算及应用  

Application and quantitative calculation of aberration-corrected high resolution images at picometer precision

作　　者：卢江波[1] 林艳利 杨元勋 田晨阳 张永森 朱陆军 陈晓明[1] 马超 LU Jiangbo;LIN Yanli;YANG Yuanxun;TIAN Chenyang;ZHANG Yongsen;ZHU Lujun;CHEN Xiaoming;MA Chao(School of Physics and Information Technology,Shaanxi Normal University,Xi′an 710119,Shaanxi,China;College of Materials Science and Engineering,Hunan University,Changsha 410082,Hunan,China)

机构地区：[1]陕西师范大学物理学与信息技术学院,陕西西安710119 [2]湖南大学材料科学与工程学院,湖南长沙410082

出　　处：《陕西师范大学学报（自然科学版）》2021年第4期79-85,共7页Journal of Shaanxi Normal University：Natural Science Edition

基　　金：国家自然科学基金(51501143);陕西省自然科学基础研究计划(2021JM-203);中央高校基本科研业务费专项资金(GK202003013,GK201803016)。

摘　　要：为得到功能材料亚埃尺度的结构信息并进行定量分析,首先获得材料微观结构的像差校正高分辨原子像,之后对高分辨原子像进行形态学处理,拟合、定量计算每个原子的中心位置,得到原子极化皮米级位移,并进行误差分析。利用原子位置精确定位方法进一步对铁电薄膜PbTiO_(3)中的90°畴结构以及畴壁进行定量分析,得到了单畴的原子位移量以及“头对尾”畴界的单胞尺度极化。对LaCoO_(3)薄膜的原子分辨环形明场像进行定量分析,得到了氧八面体倾转角度大小及其在界面位置的变化。本方法可在皮米精度有效获得材料结构信息,并进行量化表征。In order to obtain the atomic arrangement at picometer scale without artifacts,a series of morphological processing of the high resolution atomic scale images are carried out with numerical program.The center of each atoms is fitted and quantitatively calculated in order to obtain the displacements of polarization and error analysis at picometer level.By using this program,the 90-degree domain structure in ferroelectric thin film PbTiO_(3)is quantitatively analyzed,and the polarization of single domain and the"head to tail"domain wall at unit cell scale are calculated and illustrated as well.In addition,this approach is further applied to quantitatively analyze the annular bright-field image,and the oxygen octahedral tilting angles in the LaCoO_(3)thin film can be measured.The present method can obtain microstructure features of materials at picometer scale and calculate them quantitatively.

关 键 词：高分辨原子像 图像处理 定量表征 PbTiO_(3)畴结构 LaCoO_(3)薄膜 

分 类 号：O469[理学—凝聚态物理]