False nonlinear effect in z-scan measurement based on semiconductor laser devices:theory and experiments  

作　　者：Hui Yan Jingsong Wei 

机构地区：[1]Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China [2]University of Chinese Academy of Sciences,Beijing 100049,China

出　　处：《Photonics Research》2014年第2期51-58,共8页光子学研究（英文版）

基　　金：This work is partially supported by the National Natural Science Foundation of China(Nos.51172253 and 61137002);the Instrument Developing Project of the Chinese Academy of Sciences(Grant No.YZ201140);the Science and Technology Commission of Shanghai Municipality(11JC1412700 and 11JC1413300).

摘　　要：With the development of semiconductor technology,semiconductor laser devices and semiconductor laser pump solid-state laser devices have been widely applied in z-scan experiments.However,the feedback light-induced output instability of semiconductor laser devices can negatively affect the accurate testing of the nonlinear index.In this work,the influence of feedback light on z-scan measurement is analyzed.Then the calculated formula of feedback light-induced false nonlinear z-scan curves is theoretically derived and experimentally verified.Two methods are proposed to reduce or eliminate the feedback light-induced false nonlinear effect.One is the addition of an attenuator to the z-scan optical path,and the other is the addition of an opto-isolator unit to the z-scan setup.The experimental and theoretical results indicate that the feedback light-induced false nonlinear effect is markedly reduced and can even be ignored if appropriate parameters are chosen.Thus,theoretical and experimental methods of eliminating the negative effect of feedback light on z-scan measurement are useful for accurately obtaining the nonlinear index of a sample.

关 键 词：laser PUMP NONLINEAR 

分 类 号：TN2[电子电信—物理电子学]