Optical length-change measurement based on an incoherent single-bandpass microwave photonic filter with high resolution  

作　　者：Ye Deng Ming Li Ningbo Huang Hui Wang Ninghua Zhu 

机构地区：[1]State Key Laboratory on Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

出　　处：《Photonics Research》2014年第4期35-39,共5页光子学研究（英文版）

基　　金：by the National Natural Science Foundation of China under 61377002,61321063,and 61090391.

摘　　要：An optical length-change measurement technique is proposed based on an incoherent microwave photonic filter(MPF).The optical length under testing is inserted into an optical link of a single-bandpass MPF based on a polarization-processed incoherent light source.The key feature of the proposed technique is to transfer the length measurement in the optical domain to the electrical domain.In the electrical domain,the measurement resolution is extremely high thanks to the high-resolution measurement of microwave frequency response.In addition,since the MPF is a single-bandpass MPF,the optical length is uniquely determined by the central frequency of the MPF.A detailed investigation of the relation between the center frequency of the MPF and the optical length change is implemented.A measurement experiment is also demonstrated,and the experimental results show that the proposed technique has a measurement sensitivity of 1 GHz/mm with a high length-measurement resolution of 1 pm in theory.The proposed approach has the advantages of high sensitivity,high resolution,and immunity to power variation in electronic and optical links.

关 键 词：filter POLARIZATION MICROWAVE 

分 类 号：TN2[电子电信—物理电子学]