基于改进Mertz法的相位校正技术研究  

Research on phase correction technique based on improved Mertz method

作　　者：邓竞蓝 童晶晶 高闽光(导师) 李相贤 李胜 李妍 韩昕 DENG Jinglan;TONG Jingjing;GAO Minguang;LI Xiangxian;LI Sheng;LI Yan;HAN Xin(Anhui Institute of Optics and Fine Mechanics,Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei 230031,China;University of Science and Technology of China,Hefei 230031,China)

机构地区：[1]中国科学院合肥物质科学研究院安徽光学精密机械研究所,安徽合肥230031 [2]中国科学技术大学,安徽合肥230026

出　　处：《量子电子学报》2021年第4期412-419,共8页Chinese Journal of Quantum Electronics

基　　金：国家重点研发计划,2018YFC0214100,2017YFC0209900;国家自然科学基金面上项目,41775158。

摘　　要：相位误差校正是恢复高质量光谱图的关键环节之一。常用的Mertz法利用过零采样的单边干涉图数据,可以快速进行相位校正。针对该方法中对非对称干涉图利用不均匀导致的光谱图高频分量恢复不准确的问题,提出基于改进Mertz法的相位校正方法。利用奇次多项式对非对称干涉图加权,使得改进的Mertz法均衡利用"小双边"干涉图的光谱信息。实验结果表明:采用所提出的改进Mertz法能有效恢复光谱的细节信息,提升仪器的信噪比。相比于线性函数加权法,所提出的奇次多项式加权在900-1100 cm^(-1)波段和2500-2600 cm^(-1)波段,平均峰-峰值信噪比分别提升了 1.2%、2.3%,均方根值信噪比分别提升了 3.6%、1.1%。Phase error correction is one of the key steps in generating high quality spectrum.The commonly used Mertz method that recovers the spectrum from zero-crossing sampled single-sided interferogram data can correct the phase error efficiently.However,this method do not uniformly utilize the asymmetric interferogram data,which causes the inaccuracy of high frequency components in the spectrogram.To address this problem,an improved Mertz-based phase correction method is proposed by weighting asymmetric interferogram with an odd polynomial.The improved Mertz method can utilize the spectral information of small bilateral interferograms uniformly.Extensive experiments demonstrate that the proposed method can effectively recover the spectral details and improve the spectral signal-to-noise ratio.Compared with the method using linear weighting function,the proposed odd polynomial increases the average peak-to-peak signal-to-noise ratio by 1.2%and 2.3%,and improves the root mean square signalto-noise ratio by 3.6%and 1.1%in 900-1100 cm^(-1) and 2500-2600 cm^(-1) bands,respectively.

关 键 词：光谱学 相位校正 改进的Mertz法 干涉图 奇次多项式加权 

分 类 号：O433.4[机械工程—光学工程]