基于阈值法的数字集成电路测试仪的研制  

Development of Digital Integrated Circuit Tester Based on Threshold Method

作　　者：于宝堃[1] 石晟屹 马望男 李寅博 刘曼迪 吴丹 YU Bao-kun;SHI Sheng-yi;MA Wang-nan;LI Yin-bo;LIU Man-di;WU Dan(College of Electronic Information and Automation,Tianjin University of Science&Technology,Tianjin 300457,China)

机构地区：[1]天津科技大学电子信息与自动化学院,天津300457

出　　处：《电脑知识与技术》2021年第19期141-142,144,共3页Computer Knowledge and Technology

基　　金：天津科技大学大学生实验室创新基金项目(1902A401)。

摘　　要：研制了一种基于阈值法的数字集成电路测试仪,用于检测74LS10、74LS138等74LS系列芯片的性能。该测试仪采用两片STM8型微控制器作为核心单元,通过测试向量集来判断芯片的性能,测试结果输出到LCD显示屏中。实际测试结果表明:该测试仪操作灵活,测试速度快,能准确检测芯片的状态,满足芯片诊断的需求。A digital integrated circuit tester based on threshold method was developed to detect performance of 74LS series chips such as 74LS10 and 74LS138.The tester used two stm8 micro-controllers as the core of system,with a set of test vectors to determine performance of chips.The test result was exported to the LCD display.The actual test results showed that the tester has features of flexible operation,fast testing speed,which can accurately detect the status of the chip and meet the needs of chip diagnostic.

关 键 词：阈值法 STM8 74LS系列芯片 

分 类 号：TN46[电子电信—微电子学与固体电子学]