检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:冯亚飞 韦承甫[1] 刘现魁[1] 任晓明[1] 王振华[1] 孟昭荣[1] Feng Yafei;Wei Chengfu;Liu Xiankui;Ren Xiaoming;Wang Zhenhua;Meng Zhaorong(The 718 Research Institute,China State Shipbuilding Corporation Limited,Handan 056027,China)
机构地区:[1]中国船舶重工集团公司第七一八研究所,河北邯郸056027
出 处:《红外与激光工程》2021年第7期194-199,共6页Infrared and Laser Engineering
基 金:国家高技术发展计划(51326010201)。
摘 要:针对高能化学激光器出光过程中存在着大比例、大PV值低阶像差这一现象,设计了专用于前5项Zernike像差检测的低阶哈特曼波前传感器。该传感器的透镜部分采用呈环形分布的6单元微透镜阵列与凸透镜组合的方法,且均用CaF2材料制作。该方法不仅可以同时用于可见光和红外光的低阶像差测量,还具有成本低、光路结构简单、探测范围大等优点,适用于环形激光束的大PV值低阶像差检测。之后还搭建了测试光路系统,测试结果表明,该低阶哈特曼波前传感器的波面测量PV值量程为±8λ(λ=3.39μm),测量精度优于λ/10 (λ=3.39μm)。Based on the fact that there were a large percentage of low-order aberrations which had large PV values in high-energy laser beam,a Hartmann-Shack wavefront sensor for measuring first five-order Zernike aberrations was presented and designed.The lens part of the sensor adopted a method with combination of a 6-units micro-lens array and a convex lens,and the micro-lens array was distributed in annular.Since the lens material of this sensor was GaF2,the designed sensor could be applied to the low-order aberrations measurement of visible and infrared laser beam.This method had the advantages of low cost,simple structure and large detection range,which was suitable for the measurement of large PV-value low-order aberrations of the annular laser beam.Afterwards,a measurement system for the low-order Hartmann-Shack wavefront sensor had been set up,and the results show that the measuring range was±8λ(λ=3.39μm)and the accuracy was less thanλ/10(λ=3.39μm).
分 类 号:TN247[电子电信—物理电子学]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.222