Escape Rate in the Bistable Sawtooth System Driven by Correlated Multiplicative and Additive White Noises  

作　　者：YOU Jing-Yun CAO Li WU Da-Jin LIANG Gui-Yun 游敬云;曹力;吴大进;梁贵云(State Key Laboratory of Laser Technology,Huazhong University of Science and Technology,Wuhan 430074;CCAST(World Laboratory),P.O.Box 8730,Beijing 100080;Department of Physics,Huazhong University of Science and Technology,Wuhan 430074)

机构地区：[1]State Key Laboratory of Laser Technology,Huazhong University of Science and Technology,Wuhan 430074 [2]CCAST(World Laboratory),P.O.Box 8730,Beijing 100080 [3]Department of Physics,Huazhong University of Science and Technology,Wuhan 430074

出　　处：《Chinese Physics Letters》2001年第2期175-177,共3页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant No.19975020。

摘　　要：We study the escape problem of a bistable sawtooth system driven by correlated multiplicative and additive white noises.Exact analytic representation of the relative escape rate is obtained.Some novel phenomena are found from the calculation result;“suppression platform”appears in the relative escape rate when the noise correlation coefficientλis positive.Moreover,for small positive values ofλ,the relative escape rate exhibits“suppression platform”and then“resonant activation”with the increasing noise strength ratio R.

关 键 词：SAWTOOTH noise ACTIVATION 

分 类 号：TL6[核科学技术—核技术及应用]