基于W态的多方测量设备无关量子密钥分配性能分析  

Performance Analysis of Multi-Party Measurement-Device-Independent Quantum Key Distribution Based on W States

作　　者：何业锋[1,2] 李丽娜 白倩 陈思昊 强雨薇 He Yefeng;Li Lina;Bai Qian;Chen Sihao;Qiang Yuwei(School of Cyberspace Security,Xi􀆳an University of Posts and Telecommunications,Xi􀆳an,Shaanxi 710121,China;Guangxi Key Laboratory of Cryptography and Information Security,Guilin University of Electronic Technology,Guilin,Guangxi 541004,China)

机构地区：[1]西安邮电大学网络空间安全学院,陕西西安710121 [2]桂林电子科技大学广西密码学与信息安全重点实验室,广西桂林541004

出　　处：《激光与光电子学进展》2021年第11期355-361,共7页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(61802302);陕西省自然科学基础研究计划项目(2021JM-462);广西密码学与信息安全重点实验室研究课题(GCIS201923)。

摘　　要：测量设备无关量子密钥分配系统能够抵御任何针对单光子探测器侧信道的攻击。为了进一步优化多方测量设备无关量子密钥分配协议,对基于W态的多方测量设备无关量子密钥分配协议进行了研究,并引入探测器品质因子(暗记数Y0与探测器探测效率ηd的比值)作为模拟参量,模拟分析了误码率和密钥生成率的影响因素。仿真结果表明:在信道传输损耗、光纤信道之间的距离和探测器品质因子三个变量中,任意一个变量的增大都会使得误码率增大,密钥生成率减小。The measurement-device-independent quantum key distribution(MDI-QKD) system can resist any attacks on the side channel of the single-photon detector. In order to further optimize the multi-party MDI-QKD protocol, this paper investigates the multi-party MDI-QKD protocol based on W states, and introduces the detector quality factor(ratio of dark count Y0 to detection efficiency ηd) as an analog parameter to simulate and analyze the factors influencing bit error rate and key generation rate. The simulation results show that the increase of any one among the three variables of channel-transmission loss, fiber-channel distance and detector quality factor enhances the bit error rate and reduces the key generation rate.

关 键 词：量子光学 W态 量子密钥分配 测量设备无关 品质因子 密钥生成率 

分 类 号：TN918[电子电信—通信与信息系统]