Photo refractive Proper ties of Paraelec trie Copper Doped Pot assium Tant ala te Niobate  

作　　者：GUAN Qingcai WANG Jiyang WANG Min LIU Yaogang WEI Jingqian ZHANG Zhiguo YANG Changxi YE Peixian 

机构地区：[1]Institute of Crystal Materials,Shandong University,Ji'nan 250100 [2]Institute of Physics,Academia sinica,Beijing 100080

出　　处：《Chinese Physics Letters》1991年第10期515-517,共3页中国物理快报（英文版）

摘　　要：The photorefractive properties of Cu doped KTa_(1-x)Nb_(x)O_(3) have been st tidied by using two-wave mixing method.The diffraction efficiency reaches as high as 52%under an electric Held.The dependences of diffraction efficiency on interference angles and applied fields Aave been studied.The maximum light induced index chajige is found to be 2.33×10^(-5) and the photorefraction sensitivity calculated is 5×10^(-6)cm^(2)/J.Experimental results demonstrate that electrons are the dominant charge carriers.

关 键 词：method refractive Copper 

分 类 号：O43[机械工程—光学工程]