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作 者:LING Zhi-Yuan HE Lin 凌志远;何林(Department of Electronic Materials Science and Engineering,College of Materials Science and Engineering,South China University of Technology,Guangzhou 510640;College of Electronic Engineering,Dongguan University of Technology,Dongguan 523808)
机构地区:[1]Department of Electronic Materials Science and Engineering,College of Materials Science and Engineering,South China University of Technology,Guangzhou 510640 [2]College of Electronic Engineering,Dongguan University of Technology,Dongguan 523808
出 处:《Chinese Physics Letters》2013年第10期143-146,共4页中国物理快报(英文版)
基 金:Supported by Fair of Science and Technical Achievements Resulted from Cooperation of Industry,Education and Academy(2009A090100003).
摘 要:The effect of the resistance R of Mn1.85Co0.3Ni0.85O4(MCN)thick-film negative-temperature-coefficient(NTC)thermistors on temperature T is studied carefully.Interestingly,the R–T relation is found to be decided simultaneously by the characteristic of the MCN oxide and the electrode structure of the NTC thermistor.For plane end electrodes,the R–T relation is nonlinear.However,for plane fork electrodes,the R–T relation can be linear.To clarify the intrinsic mechanism of the linear R–T relation,the electric field distribution in the MCN thick film is simulated.The obtained results suggest that the non-uniform electric field distribution between the electrodes is responsible for the R–T relation linearization.
关 键 词:film RELATION LINEARIZATION
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