Microdefects in Te-Rich PbTe Bulk Crystal  

作　　者：WANG Geya SHI Tiansheng ZHANG Suying 

机构地区：[1]Shanghai Institute of Metallurgy,Academia Sinica,Shanghai 200050 [2]Shanghai Institute of Technical Physics,Academia Sinica,Shanghai 200083

出　　处：《Chinese Physics Letters》1995年第8期469-472,共4页中国物理快报（英文版）

摘　　要：The microdefects in Te-rich PbTe coating material grown by Bridgman technique have been studied via transmission electron microscopy.The results indicate that the major microdefects in Te-rich PbTe crystal are plate-like defects lying on{100}plane and homogeneously distributed in the matrix with density about 1.7×10^(16)/cm^(3).They are originated from the precipitation of native point defects in Te-rich PbTe which occured in the cooling and annealing process and presented in the form of plates consisting of Te anti-site atoms or interstitial Te atoms.

关 键 词：PBTE originated DEFECTS 

分 类 号：TB3[一般工业技术—材料科学与工程]